Defect AI Summary

Panaya provides an insightful defect summary that AI automatically generates. It concisely explains the defect information, history, and other linked activities and even scans through attached images to build a meaningful abstract.

The GenAI Defect Summary feature was developed to streamline defect management by providing a comprehensive and efficient overview of defect information. It consolidates and summarizes details from various sources, making it easier for QA, testing, and development teams to track defect history, current status, and next steps.

This capability is powered by Seemore Intelligence, Panaya's Gen-AI solution.

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The Defect Summary covers several essential aspects of a defect -

General Summary: Summarizes the title and description of the defect.

Important Fields Summary: Highlights vital information such as dates, assignees, and defect statuses.

Collaboration Summary: Provides a summary of comments, including who communicated with whom, when, and the content of the exchanges.

History Summary: Tracks the history log of the defect, showing progress over time.

Associated Activities Summary: Details information from associated requirements, test cases, steps, and cycles linked to the defect.

Show/Hide Summary

You can show or hide the summary for all defects.