---
title: "Automatic Defect Fields Population from Tests"
slug: "automatic-defect-fields-population-from-tests"
updated: 2025-03-19T13:20:19Z
published: 2025-03-19T13:20:19Z
---

> ## Documentation Index
> Fetch the complete documentation index at: https://success.panaya.com/llms.txt
> Use this file to discover all available pages before exploring further.

# Automatic Defect Fields Population from Tests

You can now automatically populate defect field values from the associated test, eliminating the need for manual data entry and ensuring defects are populated accurately.

Configure field mapping and define which test and step fields should populate the defect information seamlessly.

> [!NOTE]
> Good to Know!
> 
> - Field mappings between test fields and defect fields are a one-time operation.
> - The mapping is applied only during defect creation, and any changes to the test fields afterward will not update the defect fields.
> - The mapping applies only when the defect is created [from the recorder](/v1/docs/how-to-report-a-defect-during-test-execution) or the [step/planned run grid](https://success.panaya.com/v1/docs/reporting-defects#from-the-test-steps-and-planned-runs-tabs).

To configure -

1. Click on the settings button to open up the settings panel. ![](https://cdn.document360.io/f404076c-de23-4609-848e-2dfd4ef701b0/Images/Documentation/image-4A86CIX5.png)
2. Select **View & Manage** Auto-Fill Defects from Tests.

![](https://cdn.document360.io/f404076c-de23-4609-848e-2dfd4ef701b0/Images/Documentation/image-JNCX4ZMD.png)
3. Click on the **Create mapping**button.
4. Map the defect filed you wish to populate from the test, step or planned run, and click **Save**.

![](https://cdn.document360.io/f404076c-de23-4609-848e-2dfd4ef701b0/Images/Documentation/image-FF8GBU2W.png)